描述：National Instruments offers a variety of products for designing semiconductor test systems used in validation, characterization, and production environments. The PXI platform provides a compact, zero-footprint test system that comprises modular instruments with advanced timing and synchronization technologies for measurements from DC to 6.6 GHz. The NI PXI Analog-to-Digital Converter (ADC) Test System includes the key instruments to fully characterize ADCs with up to 14-bit resolution and 200 MS/s sampling rates. The system incorporates an arbitrary waveform generator to generate analog test patterns to an ADC, high-speed digital I/O to capture ADC outputs and generate common communication protocols (SPI, I2C, JTAG), a source measure unit (SMU) for common DC parametric measurements (open/shorts, leakage testing), and a switch module to route DC instrumentation to multiple test points. The PXI ADC Test System solution features the instruments you need to take common measurements on ADCs including INL, DNL, SNR, THD, IDD, IDDQ, and voltage high/low threshold testing. Combined with NI LabVIEW software, this solution can help you quickly customize your system to take the specific measurements you need to characterize your ADC. Get up and running fast with example programs written by NI systems engineers for common measurements critical to characterizing your design.
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